Multicore Large-Scale Integration Lifetime Extension by Negative Bias Temperature Instability Recovery-Based Self-Healing
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چکیده
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Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing
1. Introduction Designing reliable systems has become more difficult in recent years. Besides conventional problems such as transistor leakage, the degradation and variation of transistor performance have a severe impact on the dependability of VLSI systems[1]-[3]. Negative-Bias-Temperature-Instability (NBTI) is one of the strongest reliability concerns for CMOS circuits[4][5]. Remarkable pheno...
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تاریخ انتشار 2012